General reference books:

Mass spectrometry (including SIMS, ICP-MS, Accelerator MS, TIMS)
Applications of inorganic mass spectrometry, by John R. De Laeter (2001) 474pp.
John Wiley & Sons, New York.
ISBN 0-471-34539-3
QD96.M3 L34

Electron microprobe
Microprobe techniques in the earth sciences. Edited by P. J. Potts, J. F. W. Bowles, S. J. B. Reed, and M. R. Cave (1995) The Mineralogical Society Series, volume 6.
ISBN 0-412-55100-4

Raman/Infrared/Nuclear Magnetic Resonance/Auger/X-ray photoelectron spectroscopy
Spectroscopic methods in mineralogy and geology. Editor, Frank C. Hawthorne (1988) Reviews in Mineralogy, volume 18. Published by the Mineralogical Society of America.

Auger electron spectroscopy, X-ray photoelectron spectroscopy
Fundamentals of surface and thin film analyses. L. C. Feldman and J. W. Mayer (1986). North-Holland Publishing.
ISBN: 0-444-00989-2

Particle-Induced X-Ray Emission Spectrometry (PIXE)
Particle-Induced X-Ray Emission Spectrometry (PIXE). Editors, Johansson, S. A. E., Campbell, J. L., and Malmqvist, K G. (1995). Volume 133 in Chemical Analysis: A series of monographs on analytical chemistry and its applications. John Wiley & Sons, New York, 451pp.
ISBN 0-471-58944-6
QD96.X2 P37

Rutherford Backscattering Spectroscopy, nuclear reaction techniques
Fundamentals of surface and thin film analyses. L. C. Feldman and J. W. Mayer (1986). North-Holland Publishing.
ISBN: 0-444-00989-2

M. Nastasi, J.W. Mayer, and J.K. Hiryonen, Ion-Solid Interactions (Cambridge University Press, Cambridge, 1996)

Surface Analysis (including dynamic and static SIMS, TOF-SIMS, and SNMS)
Practical Surface Analysis (Second Edition), Volume 2- Ion and Neutral Spectroscopy.
Edited by D. Briggs and M. Seah (1992), J. Wiley and Sons
ISBN 0 471 92092 7
TP156.S95 P73

Electron microscopy
Introduction to Mineral Sciences. Andrew Putnis (1992) Cambridge University Press.
ISBN 0-521-41922-0
QE 363.2 .P88

Minerals and reactions at the atomic scale: Transmission electron microscopy. Edited by P. R. Buseck (1992). Reviews in Mineralogy volume 27. Published by the Mineralogical Society of America.

Transmission electron microscopy. Basics (a textbook for materials science). D. B. Williams and C. Barry Carter (1996).
ISBN 0-306-45247-2
TA 417.23 .W56

X-Ray Diffraction
Modern Powder Diffraction. Edited by D. L. Bish and J. E. Post (1989). Reviews in Mineralogy, volume 20. Published by the Mineralogical Society of America.
Elements of X-Ray diffraction. B. D. Cullity (1978, second edition). Addison Wesley Publishing Company.
ISBN 0 201 01174 3

Synchrotron analyses
Applications of Synchrotron Radiation in Low-Temperature Geochemistry and Environmental Science. Edited by P. Fenter, M. Rivers, N. Sturchio, and S. Sutton (2002). Reviews in Mineralogy and Geochemistry, volume 49. Published by the Mineralogical Society of America.